Optical Multi-Sensor Metrology for Extruded Profiles
نویسندگان
چکیده
منابع مشابه
User Interface for Optical Multi-sensorial Measurements at Extruded Profiles
− Nowadays the process-control of concave extruding is a measuring task with rising requirements. A novel optical bi-sensorial measurement system – consisting of a shadowand a light-section-system – as well as suitable methods of analysis for the in-line inspection are presented. The proposals help to ensure the product quality on a higher level than before. The combination of dimensional accur...
متن کاملQualification concept for optical multi-scale multi-sensor systems
This article describes a new qualification concept for dimensional measurements on optical measuring systems. Using the example of a prototypical multi-scale multi-sensor fringe projection system for production-related inspections of sheet-bulk metal-formed parts, current measuring procedures of the optical system are introduced. Out of the shown procedures’ deficiencies, a new concept is devel...
متن کاملOptical pH Sensor Based on Quinizarin for Alkaline pH Regions
The development of an optical pH sensor based on immobilization of quinizarin (1,4-dihydroxyanthraquinone) on a triacetylcellulose membrane was described. The resulting membrane exhibited fast color change from yellow to violet, while changing the pH in alkaline region. The immobilized quinizarin showed a broader dynamic range from (pH 9.4-11.4) with respect to free form (pH 8.8-10.4). The sens...
متن کاملBasic Wavefront Aberration Theory for Optical Metrology
VIII. IX. X. XI. XII. Sign Conventions Aberration-Free Image Spherical Wavefront, Defocus, and Lateral Shift Angular, Transverse, and Longitudinal Aberration Seidel Aberrations A. Spherical Aberration B. Coma C. Astigmatism D. Field Curvature E. Distortion Zernike Polynomials Relationship between Zernike Polynomials and Third-Order Aberrations Peak-to-Valley and RMS Wavefront Aberration Strehl ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Metrology and Measurement Systems
سال: 2010
ISSN: 0860-8229
DOI: 10.2478/v10178-010-0005-9